Programme Overview
Day 1, November 9th
Registration
Welcome and opening
Robert Mark Taylor, TEMA AG
KEYNOTE: Thinking about the big picture: A human-centered approach to using AI in surface inspection
Niklas Obermann, Ruhr-University Bochum (RUB)
Coffee/Tea-Break
Room1: From inspection data to quality information
Room 2: ASIS on long products, as tubes and pipes
Steering of CGL process parameter by SIS detected defect
Jürgen Habrock; QA/QC Galvanizing expert (Freelancer)
Optical surface inspection: Fields of application and process optimization for long round or profiled metals
Jürgen Philipps; PIXARGUS GmbH
Establishment and utilization of SIS computerized infrastructure
Taesoo Moon + Co-Authors; Hyundai Steel R&D Center
3D Surface inspection in production of seamless tube
Thomas Köpsel, Burkhard Schöttler; IMS Messsysteme GmbH
Exploitation of surface inspection data for comprehensive quality and process improvements
Michael Raus + Co-Authors; QuinLogic GmbH
Surface Fault Detection (SFD) for hot steel products
Silvano Balemi; Zumbach Electronic AG
Lunch Break
Room 1: ASIS and Industry 4.0
AI-based quality assessment of steel coils considering surface defect distributions and their severity levels
Ahmad Rajabi, Jens Brandenburger; VDEh Betriebsforschungsinstitut GmbH
Integration of surface inspection data into a multi-level production planning approach in the flat steel industry
Erwin Sirovnik, Jens Brandenburger; thyssenkrupp Rasselstein GmbH, VDEh-Betriebsforschungsinstitut GmbH
Panel Discussion I
Do we need a solution to eliminate the negative effects of fluids like water, emulsion, oil in the SIS to distinguish them correctly from the critical defects?
Performance: Michael Krätzner, Salzgitter Flachstahl GmbH
Discussion with system providers and the audience
First Combined 2D and 3D Surface Inspection in a Pickling Line Starts Work
Yves Unnützer; Thyssenkrupp Rasselstein GmbH
Coffee/Tea-Break
Vendor Sessions
Latest developments in automatic surface inspection by 2D & 3D inspection and waviness recognition
Michael Hoenen; ISRA Parsytec GmbH
Tailored Inspection and Measuring Systems for your Application
IMS Messysteme GmbH
Vendor Workshops
Organized by
IMS Messsysteme GmbH
Organized by
AMETEK Surface Vision
Organized by
ISRA Parsytec GmbH
Evening Event
Day 2, November 10th
KEYNOTE: Machine learning in idustrial applications: Opportunities and challenges
Michael Heizmann; KIT Institute for Industrial Information Technology (IIIT)
KEYNOTE: How to evaluate ASIS classification performance according to the new standard VDI/VDE/VDMA 2632 part 4.2
Jens Brandenburger; VDEh-Betriebsforschungsinstitut GmbH
Quantification of the classification performance of surface inspection systems in flat steel production
Fabian Krippendorff + Co-Authors; Salzgitter Flachstahl GmbH
Coffee/Tea-Break
Room 1: Production Quality Control
Room 2: Application of 3D imaging
Automated Optical Inspection: How Reliable Coil Grading Can Be Achieved
Christian Reidler, Stephan Müller; Dr. Schenk GmbH, C.D. Wälzholz KG
Widely Advanced Rapid Profiling (WARP): A breakthrough sensor technology for high-speed and high-resolution 3D inspection of long and flat steel products
Athinodoros Klipfel; Automation Technology GmbH
Optical Inline-Inspection systems realize full quality control of production
Andreas Hofmann, Tobias Schmid-Schirling; Fraunhofer-Institute for Physical Measurement Techniques IPM
How to get out of the contrast paradigm in defect recognition?
Laurent Dorel, Clecim SAS
Edge Inspection on side-trimmed coils
Volker Schlevoigt; Unilux Europe GmbH
Lunch Break
Latest developments in automatic surface inspection
AMETEK Surface Vision
Panel Discussion II
Revamp strategies and capabilities of SIS
Performance: Kees Jonker, Tata Steel Europe
Discussion with system providers and the audience
Panel discussion III
Whilst steel producers rely on SIS for surface qualification (increased percentage of auto surface qualification), what will you be able to provide for ensuring the SIS in good performance and how to auto measure the performance?
Performance: Julien Langlois, ArcelorMittal
Discussion with system providers and the audience
Final remarks and outlook
incl. the question: "What must be developed to make the SIS a more plug and play instrument?"
End of Conference
