Preliminary PROGRAM

We are pleased that you are interested in SIS 2020.

Our preliminary programme is expected to be published in June 2020.

If you are interested in giving a lecture at SIS 2020, please have a look to the Call for Papers.

Please find below the topics, which the SIS 2020 program will deal with.

  • 3D imaging
  • Alternative sensor technologies and sensor fusion
  • ASIS assessment and monitoring
  • ASIS at high speeds, hot temperature
  • ASIS data analytics
  • ASIS for low contrast defects on strip
  • ASIS on long products, as billets, bars, rods and wires
  • ASIS on long products, as tubes and pipes
  • ASIS on slabs and heavy plate
  • Deep learning and artificial intelligence
  • From inspection data to quality information
  • Full surface characterization
  • Improvement of ASIS performance
  • Light illumination architectures
  • Limits of ASIS
  • Machine vision and pattern recognition
  • Mobile inspection
  • Parallel inspection (detection and classification)
  • Production control using ASIS data
  • Quality tracking and reporting

If you want to register as a participant, please ensure your place here:

Our sponsors and partners of the SIS 2020