We are pleased that you are interested in SIS 2020.

Our preliminary programme is expected to be published in June 2020.

If you are interested in giving a lecture at SIS 2020, please have a look to the Call for Papers.

Please find below the topics, which the SIS 2020 program will deal with.

• 3D imaging
• Alternative sensor technologies and sensor fusion
• ASIS assessment and monitoring
• ASIS at high speeds, hot temperature
• ASIS data analytics
• ASIS for low contrast defects on strip
• ASIS on long products, as billets, bars, rods and wires
• ASIS on long products, as tubes and pipes
• ASIS on slabs and heavy plate
• Deep learning and artificial intelligence
• From inspection data to quality information
• Full surface characterization
• Improvement of ASIS performance
• Light illumination architectures
• Limits of ASIS
• Machine vision and pattern recognition
• Mobile inspection
• Parallel inspection (detection and classification)
• Production control using ASIS data
• Quality tracking and reporting

If you want to register as a participant, please ensure your place here: https://sis-world.com/register